In-pixel self-calibrating IRFPA

Pierre Nicolas; Philippe Pantigny; Jacques Cluzel; Michel Vilain; Jean-Louis Ouvrier-Buffet; Jean-Jacques Yon

doi:10.1117/12.188657

17 October 1994 In-pixel self-calibrating IRFPA

Pierre Nicolas, Philippe Pantigny, Jacques Cluzel, Michel Vilain, Jean-Louis Ouvrier-Buffet, Jean-Jacques Yon

Proceedings Volume 2269, Infrared Technology XX; (1994) https://doi.org/10.1117/12.188657
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

In this paper we present a staring IRFPA including an in-pixel dc current suppression scheme. This circuit allows a self-calibration mode (SCM) suppressing the dc current. A 64 X 64 IRFPA with 100 micrometers pitch and 4.2 micrometers cut-off wavelength MCT PV detectors has been achieved and tested at 200 K. At this temperature, the ratio between dark and useful photonic current is close to 100. After SCM, the residual integrated current is reduced to typically 1% of the detector initial current. This enables the integration time to be increased by two orders of magnitude, which drastically improves IRFPA sensitivity and resolution. At 200 K operating temperature, we obtained a peak wavelength responsivity (R_(lambda p)) of 10¹⁰ V/W and a noise equivalent differential temperature (NEDT) (temporally noise limited) of 80 mK (30 degree(s) FOV, 300 K background, 200 Hz frame rate). The SCM circuit avoids integration and readout of useless information and thus releases the signal-to-noise ratio (SNR) required for the readout integrated circuit (ROIC). This makes circuit design easier, for both multiplexers and output stages, and reduces the number of bits required for digital image processing.

Citation Download Citation

Pierre Nicolas, Philippe Pantigny, Jacques Cluzel, Michel Vilain, Jean-Louis Ouvrier-Buffet, and Jean-Jacques Yon "In-pixel self-calibrating IRFPA", Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); https://doi.org/10.1117/12.188657

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