New solution for the reflection properties of the dominant TE10 mode in a rectangular waveguide due to surface cracks

F. Jay Bourland; Brian E. Skahill; Chin-Yung Yeh

doi:10.1117/12.186733

14 September 1994 New solution for the reflection properties of the dominant TE₁₀ mode in a rectangular waveguide due to surface cracks

F. Jay Bourland, Brian E. Skahill, Chin-Yung Yeh

Author Affiliations +

Proceedings Volume 2275, Advanced Microwave and Millimeter-Wave Detectors; (1994) https://doi.org/10.1117/12.186733
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

A mathematical model is described for a new microwave nondestructive testing method for surface crack detection in metals. The crack detection method uses an open-ended waveguide to scan the surface of a metal. The method's foundation is the observation that the standing wave experiences a phase shift when a crack is present within the waveguide aperture. The model exploits the small width of the crack to reduce a Helmholtz equation on a complicated geometry to three simpler problems that are solved using the method of matched asymptotic expansions. Simplifications are possible when the crack position and cross-section are independent of distance along the crack. It is shown that the crack behaves like a resonant cavity as the crack enters the waveguide aperture.

Citation Download Citation

F. Jay Bourland, Brian E. Skahill, and Chin-Yung Yeh "New solution for the reflection properties of the dominant TE₁₀ mode in a rectangular waveguide due to surface cracks", Proc. SPIE 2275, Advanced Microwave and Millimeter-Wave Detectors, (14 September 1994); https://doi.org/10.1117/12.186733

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