Laboratory calibration of x-ray transmission diffraction gratings

Daniel Dewey; Donald N. Humphries; G. Y. McLean; David A. Moschella

doi:10.1117/12.186817

16 September 1994 Laboratory calibration of x-ray transmission diffraction gratings

Daniel Dewey, Donald N. Humphries, G. Y. McLean, David A. Moschella

Proceedings Volume 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V; (1994) https://doi.org/10.1117/12.186817
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

The 336 individual grating elements making up the High-Energy Transmission Grating (HETG) will be verified and calibrated in laboratory facilities at MIT as they are fabricated. A high instrument resolving power of order E/(Delta) E approximately equals 1000 requires an overall period uniformity of better than 250 ppm. To extract the maximum astrophysical information the diffraction efficiency of the HETG will be calibrated to the 1% level (1(sigma) ). Grating element period variations are measured and mapped in the Laser Reflection facility. Collimated HeCd (3250- angstrom) or HeNe (6328-angstrom) laser light is diffracted by the samples and measured. A per-point measurement noise of below 5 ppm rms and an overall period repeatability of 40 ppm rms have been achieved. X-ray diffraction efficiency in the 0.4 to 10 keV range is calibrated in the X-ray Grating Evaluation Facility (X- GEF). The facility combines a 17 meter vacuum beam line, a multi- anode X-ray source with monitor counter, a piezo-deformed 1D Ir coated focussing optic, a single-pixel solid state detector, and a 2D imaging proportional counter. The facility operation is under computer control and test procedures, instrumentation parameters, and acquired data are managed with a database. The system uses synchrotron-calibrated reference gratings as efficiency transfer standards. Detailed characterization and modeling of the X-GEF components and test/analysis procedures are being carried out to optimize the quality of the HETG calibration.

Citation Download Citation

Daniel Dewey, Donald N. Humphries, G. Y. McLean, and David A. Moschella "Laboratory calibration of x-ray transmission diffraction gratings", Proc. SPIE 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, (16 September 1994); https://doi.org/10.1117/12.186817

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