Paper
26 April 1995 Highly precise laser frequency metrology at 1.5 μm using molecular lines
Michel de Labachelerie, Kenichi Nakagawa, K. Kourogi, Y. Awaji, T. Enami, Motoichi Ohtsu
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Abstract
Our recent detection of sub-Doppler molecular saturated-absorption lines at 1.5 micrometers , using low power laser diodes, has opened the way to a precise frequency metrology at this wavelength. Our present goal is to establish a network of highly accurate reference frequencies in this wavelength band, and to provide the simplest way to generate them for a practical frequency metrology, which is of great interest for optical fiber communications, of high resolution spectroscopy. We present an overview of our efforts toward this goal, and we show that we can expect, in the near future, to be able to assign an absolute frequency value with a approximately 100 kHz precision for almost all the above-mentioned 1.5 micrometers frequency standards.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michel de Labachelerie, Kenichi Nakagawa, K. Kourogi, Y. Awaji, T. Enami, and Motoichi Ohtsu "Highly precise laser frequency metrology at 1.5 μm using molecular lines", Proc. SPIE 2378, Laser Frequency Stabilization and Noise Reduction, (26 April 1995); https://doi.org/10.1117/12.208243
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Cited by 2 scholarly publications.
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KEYWORDS
Absorption

Frequency metrology

Semiconductor lasers

Laser metrology

Molecular lasers

Modulation

Doppler effect

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