Paper
23 December 1980 Examination Of Long Focal Length, High Altitude, Standoff Reconnaissance
O. J. Smith, H. S. Lapp, H. F. Koper, W. K. Hull, P. Brookshier, H. Q. Avera
Author Affiliations +
Abstract
0. J. Smith: The panel discussion will be broken into two (2) sessions. Today's session will be concerned with long focal length, high-altitude, standoff reconnaissance as a basic technique for the collection of intelligence information, and tomorrow afternoon we will be discussing the future of standoff reconnaissance and the expectations. The panelists invited to participate today represent a cross-section of the reconnaissance community. The panelists represent the U. S. Air Force, the U. S. Navy, a major airframe supplier, a camera supplier, and a supplier of equipment for ground exploitation. They are well-known experts in their respective fields.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
O. J. Smith, H. S. Lapp, H. F. Koper, W. K. Hull, P. Brookshier, and H. Q. Avera "Examination Of Long Focal Length, High Altitude, Standoff Reconnaissance", Proc. SPIE 0242, Long Focal Length, High Altitude Standoff Reconnaissance, (23 December 1980); https://doi.org/10.1117/12.959257
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KEYWORDS
Cameras

Reconnaissance

Sensors

Photography

Imaging systems

Reconnaissance systems

Missiles

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