Probing field distributions on waveguide structures with an atomic force/photon scanning tunneling microscope

E. G. Borgonjen; Marco H. P. Moers; A. G. T. Ruiter; Niko F. van Hulst

doi:10.1117/12.218697

6 September 1995 Probing field distributions on waveguide structures with an atomic force/photon scanning tunneling microscope

E. G. Borgonjen, Marco H. P. Moers, A. G. T. Ruiter, Niko F. van Hulst

Author Affiliations +

Proceedings Volume 2535, Near-Field Optics; (1995) https://doi.org/10.1117/12.218697
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

A `stand-alone' Photon Scanning Tunneling Microscope combined with an Atomic force Microscope, using a micro-fabricated silicon-nitride probe, is applied to the imaging of field distribution in integrated optical ridge waveguides. The electric field on the waveguide is locally probed by coupling to the evanescent wave. Application to direct observation of TM and TE modal field distributions, both in lateral and vertical direction, mode beating between low and higher order modes, and behavior of a Y-junction wavelength (de)multiplexer is demonstrated.

Citation Download Citation

E. G. Borgonjen, Marco H. P. Moers, A. G. T. Ruiter, and Niko F. van Hulst "Probing field distributions on waveguide structures with an atomic force/photon scanning tunneling microscope", Proc. SPIE 2535, Near-Field Optics, (6 September 1995); https://doi.org/10.1117/12.218697

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