Paper
8 December 1995 Side-lobe suppression in halftone PSM with optical proximity correction
In-Gyun Shin, Sung-Chul Lim, Sang-Gyun Woo, Woo-Sung Han, Young-Bum Koh
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Abstract
We simulated half-tone phase shifting masks (HT-PSMs) with dummy patterns where side-lobe effects occur. The result is that 180 degree phase angle dummy patterns between contact holes help to reduce side-lobe effects without losing peak intensities of mask patterns. We prepared experimental masks according to the optimum results of simulation, and the actual experiment produced the same results reducing side-lobe effects as the simulation.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
In-Gyun Shin, Sung-Chul Lim, Sang-Gyun Woo, Woo-Sung Han, and Young-Bum Koh "Side-lobe suppression in halftone PSM with optical proximity correction", Proc. SPIE 2621, 15th Annual BACUS Symposium on Photomask Technology and Management, (8 December 1995); https://doi.org/10.1117/12.228182
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Cited by 1 scholarly publication.
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KEYWORDS
Photomasks

Optical proximity correction

Halftones

Phase shifting

Semiconducting wafers

Optical lithography

Scanning electron microscopy

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