Influence of roughness on scattering of transmitted radiation through hollow waveguides

M. Ben-David; Reuben Dahan; Jacob Dror; Nathan I. Croitoru

doi:10.1117/12.237568

5 April 1996 Influence of roughness on scattering of transmitted radiation through hollow waveguides

M. Ben-David, Reuben Dahan, Jacob Dror, Nathan I. Croitoru

Proceedings Volume 2677, Biomedical Fiber Optics; (1996) https://doi.org/10.1117/12.237568
Event: Photonics West '96, 1996, San Jose, CA, United States

Abstract

Scattering of visible and mid-IR radiation transmitted through hollow flexible waveguides was measured employing two methods: total integrated scattered (TIS) and back scattered (BS) radiation. The root mean square ((sigma) ) of roughness was evaluated employing these two methods. This has also enabled evaluation not only of the (sigma) but also the location of important centers of scattering of the metal and dielectric deposited layers on the internal wall of waveguide tubes. Measurements of beam profile were performed using perspex cubes, in which the formed crater image has given information of the mode propagation into the waveguides as a function of distance from: (a) the coupling to the laser, (b) radius of bending, (c) ID of hollow tubes, and (d) coupled energy of laser in waveguide. It was shown that for given radii of bending whisper gallery mode of propagation appears.

Citation Download Citation

M. Ben-David, Reuben Dahan, Jacob Dror, and Nathan I. Croitoru "Influence of roughness on scattering of transmitted radiation through hollow waveguides", Proc. SPIE 2677, Biomedical Fiber Optics, (5 April 1996); https://doi.org/10.1117/12.237568

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KEYWORDS

Waveguides

Surface roughness

Scattering

Laser scattering

Reflection

Silica

Hollow waveguides

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