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27 May 1996 Uncertainty in damage-frequency threshold measurements
Jonathan W. Arenberg
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Proceedings Volume 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995; (1996) https://doi.org/10.1117/12.240359
Event: Laser-Induced Damage in Optical Materials: 1995, 1995, Boulder, CO, United States
Abstract
A Monte Carlo model was developed to investigate the distribution of laser damage threshold (LDT) results obtained via the Damage Frequency Method (DFM). The Monte Carlo model was used to determine the correlation in LDT accuracy and precisIon and the parameters of the optic, test laser and test parameters. It is seen the DFM underestimates the true LDT. The degree of underestimatIon is shown to be related to the slope of the probabIlity versus test fluence (P,4) Line. The degree of underestimation is shown further to be positively correlated to the slope of the line (P,4), with the lower slope cases producing the lowest estimates. Rules of thumb are given to determine the degree of underestimation to allow for comparison between test results.
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Jonathan W. Arenberg "Uncertainty in damage-frequency threshold measurements", Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); https://doi.org/10.1117/12.240359
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KEYWORDS
Design for manufacturing
Laser damage threshold
Laser optics
Monte Carlo methods
Electronics
Laser development
Optical testing
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