Temperature dependence of resistance in percolation systems

Andrei A. Snarskii; Andrzej Dziedzic; Benedykt W. Licznerski

doi:10.1117/12.238130

8 April 1996 Temperature dependence of resistance in percolation systems

Andrei A. Snarskii, Andrzej Dziedzic, Benedykt W. Licznerski

Proceedings Volume 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications; (1996) https://doi.org/10.1117/12.238130
Event: Metal/Nonmetal Microsystems: Physics, Technology, and Applications, 1995, Polanica Zdroj, Poland

Abstract

An analytical description of temperature dependence of resistance in a classical percolation system is presented for the first time. Three concentration ranges of conductive phase -- below and above percolation threshold as well as inside smearing region -- have been analyzed. Useability of presented results has been discussed for such random inhomogeneous media as cermet and polymer thick film resistors as well as cermet thin film ones.

Citation Download Citation

Andrei A. Snarskii, Andrzej Dziedzic, and Benedykt W. Licznerski "Temperature dependence of resistance in percolation systems", Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); https://doi.org/10.1117/12.238130

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