Surface thermal lensing technique: a novel tool for studying contamination effects on optical components

Rene Krupka; Zhouling Wu

doi:10.1117/12.258320

11 November 1996 Surface thermal lensing technique: a novel tool for studying contamination effects on optical components

Rene Krupka, Zhouling Wu

Author Affiliations +

Proceedings Volume 2864, Optical System Contamination V, and Stray Light and System Optimization; (1996) https://doi.org/10.1117/12.258320
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

Contamination-induced degradation of optics often leads to enhanced absorption, which presents a serious limit for many important applications, especially those associated with high power laser systems and/or large aperture components. For this reason many different techniques were developed during the last decade for weak absorption studies, which include laser calorimetry, photoacoustic spectroscopy, as well as various photothermal techniques. In this paper recent progress is presented for the surface thermal lensing (STL) technique, a novel photothermal method which is demonstrated to be an ultra-sensitive tool for monitoring contamination effects on optical components. Compared with the various conventional photothermal methods, such as the photothermal deflection technique, STL drastically reduces the experimental complexity but retains the advantages of being sensitive, accurate and non-contact, and capable of in-situ monitoring of optical absorption down to the sub-ppm level. Experimental data with emphasis on absorption measurements and contamination studies of optical thin films are presented.

Citation Download Citation

Rene Krupka and Zhouling Wu "Surface thermal lensing technique: a novel tool for studying contamination effects on optical components", Proc. SPIE 2864, Optical System Contamination V, and Stray Light and System Optimization, (11 November 1996); https://doi.org/10.1117/12.258320

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