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The simple nondestructive method for reconstruction of the refractive index distribution in the waveguide cross section is presented. Waveguide surface immersing and the interferometric method of registration are utilized in this technique. The interference model is discussed.
Dmitry V. Svistunov
"Method for control of profile parameters of graded-index planar waveguides", Proc. SPIE 2943, Gradient-Index Optics in Science and Engineering, (22 October 1996); https://doi.org/10.1117/12.255526
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Dmitry V. Svistunov, "Method for control of profile parameters of graded-index planar waveguides," Proc. SPIE 2943, Gradient-Index Optics in Science and Engineering, (22 October 1996); https://doi.org/10.1117/12.255526