Paper
28 February 1997 Behavior of multilayer light-sensitive resonant systems at irradiation
Y. A. Lupashko, V. V. Mussil, Alexander P. Ovcharenko
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Abstract
It is known, that multilayer interference structures -- dielectric mirrors, narrow-band filters, etc., which contain the chalcogenidic glassy semiconductors (CGS), can be used as photorecording media and secondary carriers in systems of record, storage and processing of information. It is advisable to use the focused beam at optical record for increase of speed and realizations of high resolution. In this message some phenomena in light-sensitive multilayer interference filters (IF) under influence of light beams at various geometry's and conditions of polarization are described.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. A. Lupashko, V. V. Mussil, and Alexander P. Ovcharenko "Behavior of multilayer light-sensitive resonant systems at irradiation", Proc. SPIE 3055, International Conference on Optical Storage, Imaging, and Transmission of Information, (28 February 1997); https://doi.org/10.1117/12.267690
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KEYWORDS
Optical filters

Multilayer interference

Light scattering

Dielectric polarization

Laser scattering

Rayleigh scattering

Refractive index

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