Characterization of graded d-spacing multilayers for hard x-ray telescopes

Adrian Ivan; Suzanne E. Romaine; Ricardo J. Bruni; John E. Everett; Paul Gorenstein

doi:10.1117/12.331276

19 November 1998 Characterization of graded d-spacing multilayers for hard x-ray telescopes

Adrian Ivan, Suzanne E. Romaine, Ricardo J. Bruni, John E. Everett, Paul Gorenstein

Proceedings Volume 3444, X-Ray Optics, Instruments, and Missions; (1998) https://doi.org/10.1117/12.331276
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The Multilayer Facility at the Center for Astrophysics is involved in developing graded-d spacing multilayers for coating X-ray optics for hard x-ray focusing telescopes. Graded d spacing W/C multilayers have been fabricated on flat substrates of silicon and characterized using specular x-ray reflectivity, AFM, and TEM. Results are presented and compared with theoretical models.

Citation Download Citation

Adrian Ivan, Suzanne E. Romaine, Ricardo J. Bruni, John E. Everett, and Paul Gorenstein "Characterization of graded d-spacing multilayers for hard x-ray telescopes", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331276

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