Paper
19 November 1998 Use of x-ray optical systems in a small diffractometer
Alexander V. Liutcau, Alexander V. Kotelkin, Alexander D. Zvonkov, Dimitrii B. Mateev, Svetlana V. Nikitina, Nariman S. Ibraimov
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Abstract
The use of Kumakhov halflenses in a small diffractometers with position-sensitive detector for the investigation of stress-deformation state is considered. The possibility of obtaining the system of parallel beam with a small angular divergence allows to estimate the state of stress- deformation in a various sections of object under investigation, owing to drawing near or moving away x-ray tube connected with the halflens. It is shown, that the new method should be very interesting for determination of the reliability of a real articles.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander V. Liutcau, Alexander V. Kotelkin, Alexander D. Zvonkov, Dimitrii B. Mateev, Svetlana V. Nikitina, and Nariman S. Ibraimov "Use of x-ray optical systems in a small diffractometer", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331268
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KEYWORDS
X-rays

X-ray diffraction

X-ray optics

Capillaries

Collimation

Sensors

Reliability

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