FUV interferometric spectroscopy

Jerry Edelstein; Timothy N. Miller

doi:10.1117/12.330268

10 November 1998 FUV interferometric spectroscopy

Jerry Edelstein, Timothy N. Miller

Proceedings Volume 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX; (1998) https://doi.org/10.1117/12.330268
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Dispersive interferometric spectroscopy using all-reflective optical elements can be applied to the far UV bandpass to provide very high spectroscopic resolution in a highly compact optical configuration. Dispersive interferometric spectroscopy is therefore well suited for UV and optical space-flight missions. We describe attributes of interferometric spectroscopy and show results from a laboratory demonstration of a high-resolution FUV dispersive interferometric spectrometer.

Citation Download Citation

Jerry Edelstein and Timothy N. Miller "FUV interferometric spectroscopy", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330268

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