Paper
1 December 1998 X-ray scattering applications using pulsed x-ray sources
Bennett C. Larson
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Abstract
Pulsed x-ray sources have been used in transient structural phenomena investigations for over fifty years; however, until the advent of synchrotron sources and the development of table-top picosecond lasers, general access to high temporal resolution x-ray diffraction was relatively limited. Advances in diffraction techniques, sample excitation schemes, and detector systems, in addition to increased access to pulsed sources, have led to what is now a diverse and growing array of pulsed-source measurement applications. A survey of time- resolved investigations using pulsed x-ray sources is presented and research opportunities using both present and planned pulsed x-ray sources are discussed.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bennett C. Larson "X-ray scattering applications using pulsed x-ray sources", Proc. SPIE 3451, Time Structure of X-Ray Sources and Its Applications, (1 December 1998); https://doi.org/10.1117/12.331844
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Cited by 1 scholarly publication.
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KEYWORDS
X-rays

Synchrotrons

X-ray sources

Sensors

Scattering

Picosecond phenomena

X-ray diffraction

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