Paper
7 April 1999 Finite element thermal analysis of multispectral coatings for the ABL
Rashmi S. Shah, Jerry Ray Bettis, Alan F. Stewart, Lynn Bonsall, James Copland, William Hughes, Juan Carlos Echeverry
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Abstract
The thermal response of a coated optical surface is an important consideration in the design of any high average power system. Finite element temperature distribution were calculated for both coating witness samples and calorimetry wafers and were compared to actual measured data under tightly controlled conditions. Coatings for ABL were deposited on various substrates including fused silica, ULE, Zerodur, and silicon. The witness samples were irradiate data high power levels at 1.315micrometers to evaluate laser damage thresholds and study absorption levels. Excellent agreement was obtained between temperature predictions and measured thermal response curves. When measured absorption values were not available, the code was used to predict coating absorption based on the measured temperature rise on the back surface. Using the finite element model, the damaging temperature rise can be predicted for a coating with known absorption based on run time, flux, and substrate material.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rashmi S. Shah, Jerry Ray Bettis, Alan F. Stewart, Lynn Bonsall, James Copland, William Hughes, and Juan Carlos Echeverry "Finite element thermal analysis of multispectral coatings for the ABL", Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); https://doi.org/10.1117/12.344391
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Cited by 3 scholarly publications.
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KEYWORDS
Absorption

Silicon

Zerodur

Diffusion

Semiconducting wafers

Temperature metrology

Optical coatings

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