Single-beam photothermal microscopy: a new diagnostic tool for optical materials

Zhouling Wu; Michael D. Feit; Mark R. Kozlowski; Jean-Yves Natoli; Alexander M. Rubenchik; Lynn Matthew Sheehan; Ming Yan

doi:10.1117/12.344423

7 April 1999 Single-beam photothermal microscopy: a new diagnostic tool for optical materials

Zhouling Wu, Michael D. Feit, Mark R. Kozlowski, Jean-Yves Natoli, Alexander M. Rubenchik, Lynn Matthew Sheehan, Ming Yan

Author Affiliations +

Proceedings Volume 3578, Laser-Induced Damage in Optical Materials: 1998; (1999) https://doi.org/10.1117/12.344423
Event: Laser-Induced Damage in Optical Materials: 1998, 1998, Boulder, CO, United States

Abstract

A novel photothermal microscopy (PTM) is developed which uses only one laser beam, working as both the pump and the probe. The principle of this single-beam PTM is based on the detection of the second harmonic component of the laser modulated scattering (LMS) signal. This component has a linear dependence on the optical absorptance of the tested area and a quadratic dependence on the pump laser power. Using a pump laser at the wavelengths of 514.5- and 532-nm high-resolution photothermal scans are performed for polished fused silica surfaces and a HfO₂/SiO₂ multilayer coatings. The results are compared with those from the traditional two-beam PTM mapping. It is demonstrated that the single-beam PTM is more user-friendly than conventional two-beam PTM and, offers a higher spatial resolution for defect detection.

Citation Download Citation

Zhouling Wu, Michael D. Feit, Mark R. Kozlowski, Jean-Yves Natoli, Alexander M. Rubenchik, Lynn Matthew Sheehan, and Ming Yan "Single-beam photothermal microscopy: a new diagnostic tool for optical materials", Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); https://doi.org/10.1117/12.344423

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