New uniformity measurement method for LCD panels

Thierry R. Leroux

doi:10.1117/12.344646

12 April 1999 New uniformity measurement method for LCD panels

Thierry R. Leroux

Proceedings Volume 3636, Flat Panel Display Technology and Display Metrology; (1999) https://doi.org/10.1117/12.344646
Event: Electronic Imaging '99, 1999, San Jose, CA, United States

Abstract

A new uniformity measurement method and the associated equipment is described. This method avoids the viewing angle dependence of the uniformity measurement results, which is observed with conventional area photometer methods. After describing and analyzing currently used techniques and their merits and drawbacks, the modified method is introduced and evaluated. Results of measurements carried out on a conventional TFT LCDs are analyzed.

Citation Download Citation

Thierry R. Leroux "New uniformity measurement method for LCD panels", Proc. SPIE 3636, Flat Panel Display Technology and Display Metrology, (12 April 1999); https://doi.org/10.1117/12.344646

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