Improved backward ray tracing with stochastic sampling

Seung Taek Ryu; Kyung-Hyun Yoon

doi:10.1117/12.342843

25 March 1999 Improved backward ray tracing with stochastic sampling

Seung Taek Ryu, Kyung-Hyun Yoon

Proceedings Volume 3643, Visual Data Exploration and Analysis VI; (1999) https://doi.org/10.1117/12.342843
Event: Electronic Imaging '99, 1999, San Jose, CA, United States

Abstract

This paper presents a new technique that enhances the diffuse interreflection with the concepts of backward ray tracing. In this research, we have modeled the diffuse rays with the following conditions. First, as the reflection from the diffuse surfaces occurs in all directions, it is impossible to trace all of the reflected rays. We confined the diffuse rays by sampling the spherical angle out of the reflected rays around the normal vector. Second, the traveled distance of reflected energy from the diffuse surface differs according to the object's property, and has a comparatively short reflection distance. Considering the fact that the rays created on the diffuse surfaces affect relatively small area, it is very inefficient to trace all of the sampled diffused rays. Therefore, we set a fixed distance as the critical distance and all the rays beyond this distance are ignored. The result of this research is that as the improved backward ray tracing can model the illumination effects such as the color bleeding effects, we can replace the radiosity algorithm under the limited environment.

Citation Download Citation

Seung Taek Ryu and Kyung-Hyun Yoon "Improved backward ray tracing with stochastic sampling", Proc. SPIE 3643, Visual Data Exploration and Analysis VI, (25 March 1999); https://doi.org/10.1117/12.342843

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KEYWORDS

Ray tracing

Reflection

Stochastic processes

Specular reflections

Light sources

Diffuse interreflections

Reflectivity

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