Paper
28 April 1999 Performance of titanium and amorphous germanium microbolometer infrared detectors
M. V. S. Ramakrishna, G. Karunasiri, U. Sridhar, G. Chen
Author Affiliations +
Proceedings Volume 3666, International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '98; (1999) https://doi.org/10.1117/12.347954
Event: International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '98, 1998, New Delhi, India
Abstract
There is a considerable interest in recent years on microbolometer infrared detectors, due to the possibility of operating them at room temperature and the compatibility with CMOS fabrication process. In this work, we have fabricated bolometers with Ti and a:Ge as the sensing elements using a CMOS compatible process. Noise measurements indicate that detectivity D* of over 1.5 X 109 cmHz-1/2W-1 and 4 X 109 cmHz-1/2W-1 at 30 Hz could be realized for a:Ge and Ti bolometers, respectively. With further improvements in design and processing, it is estimated that bolometer focal plane arrays (FPAs) with noise equivalent temperature difference (NETD) of less than 50 mK are realizable using the above materials.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. V. S. Ramakrishna, G. Karunasiri, U. Sridhar, and G. Chen "Performance of titanium and amorphous germanium microbolometer infrared detectors", Proc. SPIE 3666, International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '98, (28 April 1999); https://doi.org/10.1117/12.347954
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Cited by 14 scholarly publications.
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KEYWORDS
Bolometers

Titanium

Sensors

Resistance

Germanium

Infrared detectors

Microbolometers

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