Surface profiling of an absorber embedded in a dense medium by spatial integration of the backscattered light

Toshiaki Iwai; Gaku Kimura

doi:10.1117/12.354978

19 July 1999 Surface profiling of an absorber embedded in a dense medium by spatial integration of the backscattered light

Toshiaki Iwai, Gaku Kimura

Author Affiliations +

Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.354978
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States

Abstract

The new method to reconstruct the 2D surface profile of an absorber embedded in a dense scattering medium is proposed in the report. The method is based on the fact that the intensity of the multiply-backscattered light integrated spatially by the detecting aperture with finite size is directly related with the optical path-length distribution. Experiments and Monte Carlo simulations confirm the potential and the availability of the proposed method.

Citation Download Citation

Toshiaki Iwai and Gaku Kimura "Surface profiling of an absorber embedded in a dense medium by spatial integration of the backscattered light", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.354978

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available