Flight test results from the ultrahigh-resolution electro-optical framing camera containing a 9216 by 9216 pixel wafer scale focal plane array

Bruce Matthews; Theodore Zwicker

doi:10.1117/12.372652

7 December 1999 Flight test results from the ultrahigh-resolution electro-optical framing camera containing a 9216 by 9216 pixel wafer scale focal plane array

Bruce Matthews, Theodore Zwicker

Author Affiliations +

Proceedings Volume 3751, Airborne Reconnaissance XXIII; (1999) https://doi.org/10.1117/12.372652
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

The details of the fabrication and results of laboratory testing of the Ultra High Resolution Framing Camera containing on- chip forward image motion compensation were presented to the SPIE at Airborne Reconaissance XXII in 1998. Three airborne flight tests of the Camera system have since been conducted with excellent results. This paper summarizes predicted performance for the Camera and presents some of the flight test imagery and data.

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Bruce Matthews and Theodore Zwicker "Flight test results from the ultrahigh-resolution electro-optical framing camera containing a 9216 by 9216 pixel wafer scale focal plane array", Proc. SPIE 3751, Airborne Reconnaissance XXIII, (7 December 1999); https://doi.org/10.1117/12.372652

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