Paper
12 November 1999 Influence of two-dimensional electron gas on the noise behavior of hetero-FETs at millimeter-wave frequencies
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Abstract
A rigorous 2D physical simulator is developed to determine the noise behavior of subhalf-micrometer gate-length FETs taking into account the non-stationary transport properties and the quantization effects. The microscopic nature of the simulator allows better understanding of the physical operation of these devices. As an example, the model is applied to compare and to accurately interpret the noise behavior of similar MESFET and Hetero-FET structures, to determine the physical phenomena which dominate their behavior, and to suggest different possibilities to improve the noise performance in a wide frequency range of operation.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ali Abou-Elnour "Influence of two-dimensional electron gas on the noise behavior of hetero-FETs at millimeter-wave frequencies", Proc. SPIE 3795, Terahertz and Gigahertz Photonics, (12 November 1999); https://doi.org/10.1117/12.370147
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KEYWORDS
Field effect transistors

Instrument modeling

Performance modeling

Scattering

Doping

Lithium

Quantization

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