Paper
3 September 1999 Modifications of DLC films for MEMS applications
Franklin Chau-Nan Hong, Yoou-Bin Guo, Jiun-Yao Wang
Author Affiliations +
Proceedings Volume 3875, Materials and Device Characterization in Micromachining II; (1999) https://doi.org/10.1117/12.360463
Event: Symposium on Micromachining and Microfabrication, 1999, Santa Clara, CA, United States
Abstract
SiOx-containing DLC films are deposited by plasma enhanced chemical vapor deposition on Si substrate. The effect of SiOx dopants on the stress, adhesion and hydrophobicity of the DLC films are studied. The incorporation of SiOx in the DLC films deposited by using hexamethyldisiloxane and CH4 mixture reduces the residual stress as well as enhances adhesion of the film on the substrate. Besides, the thermal stability of the film also improves.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Franklin Chau-Nan Hong, Yoou-Bin Guo, and Jiun-Yao Wang "Modifications of DLC films for MEMS applications", Proc. SPIE 3875, Materials and Device Characterization in Micromachining II, (3 September 1999); https://doi.org/10.1117/12.360463
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KEYWORDS
Silicon

Carbon

Diamond

Microelectromechanical systems

Capillaries

Surface roughness

Chemical vapor deposition

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