Paper
4 November 1999 Ultimate information characteristics of electronic-vision systems
Mikhail A. Trishenkov, Igor I. Taubkin
Author Affiliations +
Proceedings Volume 3898, Photonic Systems and Applications in Defense and Manufacturing; (1999) https://doi.org/10.1117/12.368505
Event: International Symposium on Photonics and Applications, 1999, Singapore, Singapore
Abstract
It is shown that the theoretical limit of the specific information capacity of electronic-vision systems depends only on density of photon flow producing the image and is directly proportional to this density. However, at significant flows the information capacity is restricted by diffraction effects in optics and the capacity of electron storages in pixels. The ultimate information capacity of multispectral electronic-vision systems is evaluated.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mikhail A. Trishenkov and Igor I. Taubkin "Ultimate information characteristics of electronic-vision systems", Proc. SPIE 3898, Photonic Systems and Applications in Defense and Manufacturing, (4 November 1999); https://doi.org/10.1117/12.368505
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KEYWORDS
Staring arrays

Diffraction

Sensors

Charge-coupled devices

Objectives

Electrons

Optics manufacturing

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