Paper
13 May 2000 Quantifying residual stresses by means of thermoelastic stress analysis
Author Affiliations +
Abstract
This study focused on the application of the Thermoelastic Stress Analysis (TSA) technique as a tool for assessing the residual stress state of structures. TSA is based on the fact that materials experience small temperature changes when compressed or expanded. When a structure is cyclically loaded, a surface temperature profile results which correlates to the surface stresses. The cyclic surface temperature is measured with an infrared camera. Traditionally, the amplitude of a TSA signal was theoretically defined to be linearly dependent on the cyclic stress amplitude. Recent studies have established that the temperature response is also dependent on the cyclic mean stress (i.e., the static stress state of the structure). In a previous study by the authors, it was shown that mean stresses significantly influenced the TSA results for titanium and nickel based alloys. This study continued the effort of accurate direct measurements of the mean stress effect by implementing newly developed temperature correction curves. In addition, a more in-depth analysis was conducted which involved analyzing the second harmonic of the temperature response. By obtaining the amplitudes of the first and second harmonics, the stress amplitude and the mean stress at a given point on a structure subjected to a cyclic load can be simultaneously obtained. The experimental results showed good agreement with the theoretical predictions for both the first and second harmonics of the temperature response. As a result, confidence was achieved concerning the ability to simultaneously obtain values for the static stress state as well as the cyclic stress amplitude of structures subjected to cyclic loads using the TSA technique. With continued research, it is now feasible to establish a protocol that would enable the monitoring of residual stresses in structures utilizing the TSA technique.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew L. Gyekenyesi and George Y. Baaklini "Quantifying residual stresses by means of thermoelastic stress analysis", Proc. SPIE 3993, Nondestructive Evaluation of Aging Materials and Composites IV, (13 May 2000); https://doi.org/10.1117/12.385479
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CITATIONS
Cited by 13 scholarly publications.
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KEYWORDS
Temperature metrology

Cameras

Sensors

Infrared cameras

Stress analysis

Titanium

Nickel

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