Paper
31 August 2000 Novel laser full-field extensometer integrated with loading machine
Author Affiliations +
Proceedings Volume 4076, Optical Diagnostics for Industrial Applications; (2000) https://doi.org/10.1117/12.397952
Event: Symposium on Applied Photonics, 2000, Glasgow, United Kingdom
Abstract
Breaking barrier of the mass production of novel materials (composite, smart, enhanced by surface layers) and introducing new technologies (laser processing, joint between nonconventional materials) pose new requirements for the industrial systems of full-field strain analysis. This quality of experimental data has to be sufficient to introduce them into numerical analysis (FEM) to perform complicated modelling of fracture mechanics, fatigue process or residual stress distribution. The experimental method, which fulfills the quality requirements, is grating interferometry. In the paper the novel type of laser full-field extensometer based on four-beam grating (moire) interferometry is presented. It is designed for medium size field of view (6 x 4.5 mm2). The extensometer is integrated and works directly on a standard loading machine with the possibility to control the load on the base of local on-line strain measurements. It enables the measurements during static, monotonic and cyclic loads and full-field analysis of arbitrary sequence of images. The extensometers give high contrast and good quality interferograms, are insensitive to vibrations and work with simple, low cost laser diode. The capabilities of the extensometers are presented on the example of low cyclic fatigue testing of steel specimens with hold and notch.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Leszek A. Salbut "Novel laser full-field extensometer integrated with loading machine", Proc. SPIE 4076, Optical Diagnostics for Industrial Applications, (31 August 2000); https://doi.org/10.1117/12.397952
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interferometry

Semiconductor lasers

Diffraction gratings

Laser energy

Laser interferometry

Strain analysis

Finite element methods

Back to Top