Internal stress model for abnormal p-e hysteresis behavior of inhomogeneous Ba0.7Sr0.3TiO3 thin films

Yongping Ding; Zhongyan Meng

doi:10.1117/12.408345

29 November 2000 Internal stress model for abnormal p-e hysteresis behavior of inhomogeneous Ba_0.7Sr_0.3TiO₃ thin films

Yongping Ding, Zhongyan Meng

Author Affiliations +

Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408345
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China

Abstract

The inhomogeneous Ba_0.7Sr_0.3TiO₂ thin films characterized by Ba/Sr ratio fluctuation in micro-region hold the P-E hysteresis loop from low temperature to 150 degree(s)C, which is higher than the upper limited Curie temperature of Ba_1-xSr_xTiO₃ (BST) solid solutions. The fluctuation of Ba/Sr ratio in sub-micron scope results in abnormal ferroelectric behavior for BST thin films. We suggest that this phenomenon can be explained by the internal stress effect caused by lattice mismatch in the inhomogeneous BST thin films. The inhomogeneity of the thin film was simulated according to the Gaussian distribution and the internal stress was calculated. The simulated results show that three kinds of typical stressed micro-regions exist in the inhomogeneous film. Especially, the Ba-rich micro-regions are compressed biaxially in film plane, which tends to promote the polarization normal to the film plane and so ferroelectricity of the Ba-rich micro- regions keeps to higher temperature. The internal stress model is reasonable to explain the ferroelectric abnormality of the thin films.

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Yongping Ding and Zhongyan Meng "Internal stress model for abnormal p-e hysteresis behavior of inhomogeneous Ba_0.7Sr_0.3TiO₃ thin films", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); https://doi.org/10.1117/12.408345

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