Paper
5 October 2000 Novel F-P dual interferometer for measuring small displacement
Author Affiliations +
Proceedings Volume 4223, Instruments for Optics and Optoelectronic Inspection and Control; (2000) https://doi.org/10.1117/12.401760
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
An optical fiber dual-interferometer for measuring small displacement has been developed in this paper. A wavelength- scanning source is used to simultaneously illuminate two Fabry-Perot cavities. One is as the sensing cavity, the other is as the reference cavity. If the length of the reference cavity is pre-calibrated and maintain constant, and the scanning wavelength is taken as an inter-converter to compare the gap length of the sensing cavity with the reference cavity length, using the frequency spectrum separator, absolute measurement can be obtained.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhaoxia Wu, Zhiquan Li, Kai Tong, and Xifu Qiang "Novel F-P dual interferometer for measuring small displacement", Proc. SPIE 4223, Instruments for Optics and Optoelectronic Inspection and Control, (5 October 2000); https://doi.org/10.1117/12.401760
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interferometers

Optical fibers

Diffraction gratings

Fabry–Perot interferometers

Interfaces

Light sources

Optical filters

Back to Top