Paper
30 March 2001 Seal characterization for supernarrow periphery LCD panel
Shunji Suzuki, Michikazu Noguchi, Kohichi Miwa, Yoshiharu Fujii, Donald P. Seraphim, Dean Skinner
Author Affiliations +
Proceedings Volume 4294, Projection Displays VII; (2001) https://doi.org/10.1117/12.420779
Event: Photonics West 2001 - Electronic Imaging, 2001, San Jose, CA, United States
Abstract
Control of the seal edge of LC cells with super narrow periphery is very important for the application to compact AM-LCD designs. Several thermal cure epoxy resins have been studied as candidates for LC panel seal materials, with emphasis on characterizing the seal edge. The factors affecting material selection are its effect on LC alignment, the seal edge waviness or straightness, the formation of the seal edge boundary during lamination and cure and finally, its compatibility with standard cell processing techniques. Optimal seal material selection is discussed in view of its application to the design and fabrication of super narrow periphery LC cells. Cell design of seal edge control is also discussed in view of application of seal characterization and structural contribution, including material and process matching.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shunji Suzuki, Michikazu Noguchi, Kohichi Miwa, Yoshiharu Fujii, Donald P. Seraphim, and Dean Skinner "Seal characterization for supernarrow periphery LCD panel", Proc. SPIE 4294, Projection Displays VII, (30 March 2001); https://doi.org/10.1117/12.420779
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
LCDs

Liquid crystals

Epoxies

Optical filters

Contamination

Metals

Control systems

Back to Top