Measuring spherical aberration for the dynamic compensation of substrate-thickness errors

Takeshi Shimano; Tetsuo Ariyoshi; Mariko Umeda; Takeshi Maeda; Hirofumi Sukeda; Takuji Nomura; Kouichi Murata

doi:10.1117/12.453393

10 January 2002 Measuring spherical aberration for the dynamic compensation of substrate-thickness errors

Takeshi Shimano, Tetsuo Ariyoshi, Mariko Umeda, Takeshi Maeda, Hirofumi Sukeda, Takuji Nomura, Kouichi Murata

Proceedings Volume 4342, Optical Data Storage 2001; (2002) https://doi.org/10.1117/12.453393
Event: Optical Data Storage, 2001, Santa Fe, NM, United States

Abstract

In high-density optical disc systems that use high-NA objective lenses and multi-layered discs, it is important to reduce spherical aberration (SA). With high-NA lenses, SA is induced by errors in substrate thickness. The distance between layers in multi-layered discs also leads to SA. To use a type of phase-shifting device as a dynamic compensator for SA, a method of differential focus-error detection has been proposed for the real-time measurement of SA as a spherical aberration signal (SAS). The derivation of an equivalent substrate-thickness variation from the SAS with an accuracy of up to 0.8 mm is demonstrated in this paper. Using the SAS to drive a liquid-crystal phase-shifter, the fluctuation of the SAS caused by the substrate thickness error has been suppressed successfully during real-time disc rotation.

Citation Download Citation

Takeshi Shimano, Tetsuo Ariyoshi, Mariko Umeda, Takeshi Maeda, Hirofumi Sukeda, Takuji Nomura, and Kouichi Murata "Measuring spherical aberration for the dynamic compensation of substrate-thickness errors", Proc. SPIE 4342, Optical Data Storage 2001, (10 January 2002); https://doi.org/10.1117/12.453393

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