Paper
1 February 2001 Weak localization of electrons by Auger emission
Victor V. Dubov, Vadim V. Korablev
Author Affiliations +
Proceedings Volume 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2001) https://doi.org/10.1117/12.417654
Event: Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 2000, St. Petersburg, Russian Federation
Abstract
The effect of the new type of weak localization of electrons scattered inelastically from disordered media on Auger emission spectra is studied. This type of weak localization leads to modification of the angular spectra and energy distributions of Auger electrons. The results obtained can be applied to the determination of the characteristics of crystal surface region. It was shown that the dependence of the scattering intensity of Auger electron on an azimuthal angle is due to coherent effects. The diagram technique allows to calculate the wave function of Auger electrons more exactly. The method in question can be used for detailed description not only particle emission measurements, but also for X-ray radiation.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor V. Dubov and Vadim V. Korablev "Weak localization of electrons by Auger emission", Proc. SPIE 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (1 February 2001); https://doi.org/10.1117/12.417654
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KEYWORDS
Electrons

Scattering

Crystals

Solids

Chemical species

Photons

Spherical lenses

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