Paper
11 March 2002 Zep process optimization for submicron reticle fabrication in high-acceleration voltage writing tool
Junsik S. Cho, Lee-Ju Kim, Cheol Shin
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Abstract
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© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Junsik S. Cho, Lee-Ju Kim, and Cheol Shin "Zep process optimization for submicron reticle fabrication in high-acceleration voltage writing tool", Proc. SPIE 4562, 21st Annual BACUS Symposium on Photomask Technology, (11 March 2002); https://doi.org/10.1117/12.458349
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KEYWORDS
Dry etching

Reticles

Manufacturing

Scattering

Photomasks

Critical dimension metrology

Optical proximity correction

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