Paper
9 April 2002 UV-laser conditioning for reduction of 351-nm damage initiation in fused silica
Raymond M. Brusasco, Bernie M. Penetrante, John E. Peterson, Stephen M. Maricle, Joseph A. Menapace
Author Affiliations +
Abstract
This paper describes the effect of 355-nm laser conditioning on the concentration of UV-laser-induced surface damage sites on large-aperture fused silica optics. We will show the effect of various 355-nm laser conditioning methodologies on the reduction of surface-damage initiation in fused silica samples that have varying qualities of polishing. With the best, generally available fused silica optic, we have demonstrated that 355-nm laser conditioning can achieve up to 10x reduction in surface damage initiation concentration in the fluence range of 10-14 J/cm2 (355- nm at 3 ns).
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Raymond M. Brusasco, Bernie M. Penetrante, John E. Peterson, Stephen M. Maricle, and Joseph A. Menapace "UV-laser conditioning for reduction of 351-nm damage initiation in fused silica", Proc. SPIE 4679, Laser-Induced Damage in Optical Materials: 2001, (9 April 2002); https://doi.org/10.1117/12.461718
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Cited by 19 scholarly publications.
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KEYWORDS
Laser induced damage

Silica

Raster graphics

Etching

Surface finishing

Polishing

Laser damage threshold

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