Characterization of linear diattenuator and retarders using a two-modulator generalized ellipsometer (2-MGE)

Gerald E. Jellison Jr.; C. Owen Griffiths; David Eugene Holcomb; Christopher M. Rouleau

doi:10.1117/12.450409

25 September 2002 Characterization of linear diattenuator and retarders using a two-modulator generalized ellipsometer (2-MGE)

Gerald E. Jellison Jr., C. Owen Griffiths, David Eugene Holcomb, Christopher M. Rouleau

Author Affiliations +

Proceedings Volume 4819, Polarization Measurement, Analysis, and Applications V; (2002) https://doi.org/10.1117/12.450409
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

The two-modulator generalized ellipsometer (2-MGE) is a spectroscopic polarization-sensitive optical instrument that is sensitive to both standard ellipsometric parameters from isotropic samples as well as cross polarization terms arising from anisotropic samples. In reflection mode, teh 2-MGE has been used to measure the complex dielectric functions of several uniaxial crystals, including TiO₂, ZnO, and BiI₃. The 2-MGE can also be used in the transmission mode, in which the complete Mueller matrix of a sample can be determined (using 4 zone measurements). If the sample is a linear diattenuator and retarder, then only a single zone is required to determine the sample retardation, diattenuation, the principal axis direction, and the depolarization. These measurements have been performed in two different modes: 1) Spectroscopic, where the current wavelength limits are 260 to 850 nm, and 2) Spatially resolved (Current resolution ~30-50 microns) at a single wavelength. The latter mode results in retardation, linear diattenuation, and principal axis direction "maps" of the sample. Two examples are examined in this paper. First, a simple Polaroid film polarizer is measured, where it is seen that the device behaves nearly ideally in its design wavelength range (visible), but acts more as a retarder in the infrared. Second, congruently grown LiNbO₃ is examined under bias. These results show that there are significant variations in the electric field-Pockels coefficient product within the material. Spectroscopic measurements are used to determine the dispersion of the r₂₂ Pockels coefficient.

Citation Download Citation

Gerald E. Jellison Jr., C. Owen Griffiths, David Eugene Holcomb, and Christopher M. Rouleau "Characterization of linear diattenuator and retarders using a two-modulator generalized ellipsometer (2-MGE)", Proc. SPIE 4819, Polarization Measurement, Analysis, and Applications V, (25 September 2002); https://doi.org/10.1117/12.450409

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available