Paper
17 January 2003 Modeling and validation of a molded polycarbonate continuous-flow polymerase chain reaction devic
Michael W. Mitchell, Xuezhu Liu, Yannick Bejat, Dimitris E. Nikitopoulos, Steven A. Soper, Michael C. Murphy
Author Affiliations +
Proceedings Volume 4982, Microfluidics, BioMEMS, and Medical Microsystems; (2003) https://doi.org/10.1117/12.478142
Event: Micromachining and Microfabrication, 2003, San Jose, CA, United States
Abstract
A continuous flow polymerase chain reaction (CFPCR) system was designed, fabricated from molded polycarbonate, and tested. Finite element modeling was used to simulate the thermal and Microfluidic response of the system. The mold insert for the initial prototypes was fabricated using the X-ray LIGA microfabrication process and device components produced by hot embossing polycarbonate. Commercial thin film heaters under PID control were used to supply the necessary heat flux to maintain the steady-state temperatures in the PCR. The simulated transient temperature response at start up was compared to the experimental response. The simulated steady state temperature profile along the channel generated by the finite element analysis was compared to the experimental temperature profile displayed by liquid crystals. Experimental and simulated results were within 5% of each other, validating the thermal design of the CFPCR device.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael W. Mitchell, Xuezhu Liu, Yannick Bejat, Dimitris E. Nikitopoulos, Steven A. Soper, and Michael C. Murphy "Modeling and validation of a molded polycarbonate continuous-flow polymerase chain reaction devic", Proc. SPIE 4982, Microfluidics, BioMEMS, and Medical Microsystems, (17 January 2003); https://doi.org/10.1117/12.478142
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Cited by 12 scholarly publications and 31 patents.
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KEYWORDS
Liquid crystals

Microfluidics

Polymers

Scanning electron microscopy

Instrument modeling

Finite element methods

Temperature metrology

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