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Electrically variable reflectivity electrochromic windows have the potential to significantly reduce heating and cooling loads in buildings. The importance of reducing the optical frequencies free electron scattering in the variable reflectivity electrochromic layer will be shown. Based on spectroscopic ellipsometry studies and an analysis of the dynamical resistivity of polycrystalline films of colored W03 and of single crystals of NaxW03, it is tentatively concluded that the principal source of free electron scattering in W03 films is structural disorder, and probably crystallographic shear planes which act as monopolar dislocations. This is in contrast to the much higher reflectivity single crystal tungsten bronzes for which the more dominant scattering mechanism appears to be that associated with ionized impurities. We therefore conclude that it should be possible to improve the reflectivity modulation in films of electrochromic TM), and consequently that a practical variable reflectivity electrochromic window should be acriievable.
R. B. Goldner,A. Brofos,G. Foley,E. L. Goldner,T. E. Haas,W. Henderson,P. Norton,B. A. Ratnam,N. Weis, andK. K. Wong
"Optical Frequencies Free Electron Scattering Studies On Electrochromic Materials For Variable Reflectivity Windows", Proc. SPIE 0502, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion III, (2 November 1984); https://doi.org/10.1117/12.944785
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R. B. Goldner, A. Brofos, G. Foley, E. L. Goldner, T. E. Haas, W. Henderson, P. Norton, B. A. Ratnam, N. Weis, K. K. Wong, "Optical Frequencies Free Electron Scattering Studies On Electrochromic Materials For Variable Reflectivity Windows," Proc. SPIE 0502, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion III, (2 November 1984); https://doi.org/10.1117/12.944785