PEEM/LEEM resolution

O. D. Potapkin; A. S. Belanov

doi:10.1117/12.498007

1 April 2003 PEEM/LEEM resolution

O. D. Potapkin, A. S. Belanov

Proceedings Volume 5025, Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics; (2003) https://doi.org/10.1117/12.498007
Event: Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics, 2001, Moscow, Russian Federation

Abstract

Universal expression for PEEM/LEEM resolution was found for a case when chromatical aberration and diffraction are limiting factors and for compound electrostatic and magnetic fields. This expression has the following advantage: it depends on emission energy and as a result resolution can be calculated for any electron start energy using psi function. It can be useful to find the best theoretical resolution.

Citation Download Citation

O. D. Potapkin and A. S. Belanov "PEEM/LEEM resolution", Proc. SPIE 5025, Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics, (1 April 2003); https://doi.org/10.1117/12.498007

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