HgCdTe buried planar structures fabricated by liquid phase epitaxy

Waldemar Gawron; Krzysztof Adamiec

doi:10.1117/12.519673

22 October 2003 HgCdTe buried planar structures fabricated by liquid phase epitaxy

Waldemar Gawron, Krzysztof Adamiec

Proceedings Volume 5136, Solid State Crystals 2002: Crystalline Materials for Optoelectronics; (2003) https://doi.org/10.1117/12.519673
Event: 2003 Chapter books, 2003, Bellingham, WA, United States

Abstract

This article reports the use of liquid phase epitaxy to fabricate buried HgCdTe photodiodes. Modern epitaxial techniques make possible to grow complex heterostructures with precise control of band gap and doping level profiles which can be applied for high performance optoelectronic devices. More complex heterostructures can be grown with 3 dimensional (3D) ban gap engineering using multiple epitaxy, selective growth, growth on profiled substrate and combination of these methods. We report an investigation of Hg_1-xCd_xTe epitaxial layers grown on holes etched in CdZnTe(111)B substrates. Prior to growth of HgCdTe layers the substrate has been etched to form holes on 30 μm diameter and 20 μm depth. Next, 20-μm thick HgCdTe epitaxial layer has been grown by liquid phase epitaxy (LPE) from Te-rich solution. The Nomarski microscopy showed that the surface of specially prepared layers was flat and the composition of layers measured by FTIR microscopy was homogeneous. Samples were cleaved and examined in cross section by SEM.

Citation Download Citation

Waldemar Gawron and Krzysztof Adamiec "HgCdTe buried planar structures fabricated by liquid phase epitaxy", Proc. SPIE 5136, Solid State Crystals 2002: Crystalline Materials for Optoelectronics, (22 October 2003); https://doi.org/10.1117/12.519673

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