Paper
16 October 2003 Reflection and transmission scattering by rough plane surface of glass hemisphere
Author Affiliations +
Abstract
Polarization of both Reflection and transmission scatterings by a rough plane surface of a glass hemisphere with a smooth spherical surface were measured. Null ellipsometry was used to measure the ellipsometric parameters and depolarization. Linear polarization, circular polarization, and principal Mueller matrix were obtained from the above measured quantities. Scattering was measured at fixed incident and detection directions, and variable sample orientation. The scattering and its polarization and depolarization are symmetric with the off-specular angle (OSA). The measured linear polarization increases with increasing OSA, and may change sign for large OSA. Reflection scattering shows more depolarization than the transmission scattering and so do the deviations from the specular values for all parameters.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Soe-Mie F. Nee and Tsu-Wei Nee "Reflection and transmission scattering by rough plane surface of glass hemisphere", Proc. SPIE 5189, Surface Scattering and Diffraction III, (16 October 2003); https://doi.org/10.1117/12.507780
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Scattering

Reflection

Polarization

Bidirectional reflectance transmission function

Light scattering

Glasses

Ellipsometry

RELATED CONTENT

Polarization of scattering by a rough paint surface
Proceedings of SPIE (October 22 2002)
Modeling the appearance of special effect pigment coatings
Proceedings of SPIE (October 23 2001)
Scattering Matrix Measurements Of Oceanic Hydrosols
Proceedings of SPIE (November 10 1978)
Scattering from sinusoidal gratings
Proceedings of SPIE (September 26 1997)
Polarization of scattering by rough surfaces
Proceedings of SPIE (October 30 1998)

Back to Top