Yield Analysis For Electroluminescent Panel Development

M. I. Abdalla; E. A. Davey; T. FohI; J. L. Gibbons; L. L. Hope; K. A. Petersen; J. L. Plumb; M. P. Schrank

doi:10.1117/12.946381

13 May 1985 Yield Analysis For Electroluminescent Panel Development

M. I. Abdalla, E. A. Davey, T. FohI, J. L. Gibbons, L. L. Hope, K. A. Petersen, J. L. Plumb, M. P. Schrank

Proceedings Volume 0526, Advances in Display Technology V; (1985) https://doi.org/10.1117/12.946381
Event: 1985 Los Angeles Technical Symposium, 1985, Los Angeles, United States

Abstract

Yield issues for fabrication of electroluminescent display panels through the development program cycle are discussed. A model based on learning curve theory is presented which allows estimation of time and resources required for development of panels meeting prescribed technical specifications including freedom from defects. The analysis is supported by data on development history of EL devices.

Citation Download Citation

M. I. Abdalla, E. A. Davey, T. FohI, J. L. Gibbons, L. L. Hope, K. A. Petersen, J. L. Plumb, and M. P. Schrank "Yield Analysis For Electroluminescent Panel Development", Proc. SPIE 0526, Advances in Display Technology V, (13 May 1985); https://doi.org/10.1117/12.946381

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