Paper
25 March 2004 Periodically arranged point defects in a 2D photonic crystal: the photonic analogue to a doped semiconductor
Stefan Richter, Stefan L. Schweizer, Reinald Hillebrand, Cecile Jamois, Ralf Boris Wehrspohn, Margit Zacharias, Ulrich Goesele
Author Affiliations +
Proceedings Volume 5277, Photonics: Design, Technology, and Packaging; (2004) https://doi.org/10.1117/12.522063
Event: Microelectronics, MEMS, and Nanotechnology, 2003, Perth, Australia
Abstract
We present and characterize hexagonal point defects in a two dimensional photonic crystal based on macroporous silicon. These point defects are prepatterned periodically, forming a superstructure within the photonic crystal after electrochemical etching. Spatially resolved, optical investigations related to morphological properties, like defect concentration and pore radius, are compared to bandstructure calculations. The confined defect states are identified and their interaction is evaluated quantitatively.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stefan Richter, Stefan L. Schweizer, Reinald Hillebrand, Cecile Jamois, Ralf Boris Wehrspohn, Margit Zacharias, and Ulrich Goesele "Periodically arranged point defects in a 2D photonic crystal: the photonic analogue to a doped semiconductor", Proc. SPIE 5277, Photonics: Design, Technology, and Packaging, (25 March 2004); https://doi.org/10.1117/12.522063
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photonic crystals

Crystals

Reflection

Resonators

Semiconductors

Silicon

Dielectrics

Back to Top