Paper
15 July 2004 Laser desorption of ions from microscopically rough surfaces: novel technique for ultrahigh sensitivity detection of organic and bioorganic compounds
Sergey Sergeivich Alimpiev, Sergey M. Nikiforov, V. A. Karavanski, Alexandr A. Grechnikov, J. Sunner
Author Affiliations +
Proceedings Volume 5506, Nonresonant Laser-Matter Interaction (NLMI-11); (2004) https://doi.org/10.1117/12.580029
Event: Nonresonant Laser-Matter Interaction (NLMI-11), 2003, St. Petersburg, Russian Federation
Abstract
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© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey Sergeivich Alimpiev, Sergey M. Nikiforov, V. A. Karavanski, Alexandr A. Grechnikov, and J. Sunner "Laser desorption of ions from microscopically rough surfaces: novel technique for ultrahigh sensitivity detection of organic and bioorganic compounds", Proc. SPIE 5506, Nonresonant Laser-Matter Interaction (NLMI-11), (15 July 2004); https://doi.org/10.1117/12.580029
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Cited by 2 scholarly publications.
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KEYWORDS
Silicon

Ionization

Ions

Semiconductor lasers

Molecules

Natural surfaces

Laser irradiation

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