Device for spectral emissivity measurements of ceramics using a FT-IR spectrometer

Wolfgang Bauer; Alexander Moldenhauer

doi:10.1117/12.560602

2 August 2004 Device for spectral emissivity measurements of ceramics using a FT-IR spectrometer

Wolfgang Bauer, Alexander Moldenhauer

Proceedings Volume 5532, Interferometry XII: Applications; (2004) https://doi.org/10.1117/12.560602
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

Ceramic materials, in particular high temperature technical ceramics and refractories, are used in a wide range of temperature. Band and total emissivities of ceramics are needed for non-contact temperature measurements and for modeling of radiation heat transfer. If the spectral emissivities are known in a sufficient range of wavelength and temperature, the band and total emissivities for most applications can be calculated. At the University Duisburg-Essen an experimental setup for measuring of temperature-dependent spectral emissivities was modernized with a FT-IR-spectrometer. A remarkable quality improvement of the measurements could be reached. The spectral and temperature ranges of the measuring device are now 0.8 to 25 μm and 100 to 1200°C. In the paper a description of the measuring device will be given and selected examples of measuring possibilities of the spectrometer are shown. By the example of high temperature ceramics the obtained improvements of the device are presented for measured temperature-dependent spectral emissivities.

Citation Download Citation

Wolfgang Bauer and Alexander Moldenhauer "Device for spectral emissivity measurements of ceramics using a FT-IR spectrometer", Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); https://doi.org/10.1117/12.560602

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