Characterization of sculptured thin films

Joseph V. Ryan; Mark W. Horn; Akhlesh Lakhtakia; Carlo G. Pantano

doi:10.1117/12.573910

29 December 2004 Characterization of sculptured thin films

Joseph V. Ryan, Mark W. Horn, Akhlesh Lakhtakia, Carlo G. Pantano

Proceedings Volume 5593, Nanosensing: Materials and Devices; (2004) https://doi.org/10.1117/12.573910
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States

Abstract

Physical vapor deposition can be used to synthesize sculptured thin films with high surface areas. Highly directional vapor deposition onto a tilted, rotating substrate has been shown to produce nanostructured materials with controlled columnar features, including zig-zag, cusp, chevron, and helical geometries. Nanoporous coatings such as these are desirable for optical sensing applications due to their accessible high surface area, but few techniques are available to quantify the surface area of thin films. Electron beam and thermal evaporation techniques are used to synthesize highly porous thin films from silicon dioxide and a germanium antimony selenide chalcogenide glass in order to explore their potential for optical applications in both the visible and infrared spectral ranges. Characterization has been performed using nitrogen adsorption isotherms obtained with a quartz crystal microbalance. It is shown that surface area can be increased up to 375 times that of a flat film by deposition at oblique angles. A nitrogen adsorption technique is introduced as a means to examine the porosity of sculptured thin films at a nanoscale.

Citation Download Citation

Joseph V. Ryan, Mark W. Horn, Akhlesh Lakhtakia, and Carlo G. Pantano "Characterization of sculptured thin films", Proc. SPIE 5593, Nanosensing: Materials and Devices, (29 December 2004); https://doi.org/10.1117/12.573910

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