Paper
31 January 2005 Theoretical and experimental investigation on carrier recovery time in semiconductor optical amplifier
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Abstract
A relatively perfect steady-state and dynamic numerical model of SOA considering facet reflectivity, gain dispersion and amplified spontaneous emission (ASE) spectrum is established to make it closer to reality. Based on the proposed numerical model, carrier recovery time is investigated under different external conditions theoretically and experimentally. Via the analysis of results of simulation and experiments, schemes for accelerating carrier recovery are explored.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiang Zhong, Xinliang Zhang, Deming Liu, and Dexiu Huang "Theoretical and experimental investigation on carrier recovery time in semiconductor optical amplifier", Proc. SPIE 5624, Semiconductor and Organic Optoelectronic Materials and Devices, (31 January 2005); https://doi.org/10.1117/12.570686
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Photons

Laser beam diagnostics

Semiconductor optical amplifiers

Reflectivity

Computer simulations

Optical simulations

Refractive index

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