Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering

M. Herms; G. Irmer; P. Verma; G. Goerigk

doi:10.1117/12.602064

9 May 2005 Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering

M. Herms, G. Irmer, P. Verma, G. Goerigk

Author Affiliations +

Proceedings Volume 5766, Testing, Reliability, and Application of Micro- and Nano-Material Systems III; (2005) https://doi.org/10.1117/12.602064
Event: Nondestructive Evaluation for Health Monitoring and Diagnostics, 2005, San Diego, CA, United States

Abstract

Laser spectroscopical methods as Raman scattering (RS) and Photoluminescence as well as Small Angle Scattering of Xrays (SAXS) are presented as powerful tools for the efficient, nondestructive and contact-less characterization of nanoparticles of low concentration (< 1% in volume) in solids in dependence on the history of thermal treatment. The complementary determination of size distribution of CdS_xSe_1-x nanocrystallites in silicate glass filters and of arsenic precipitates in low-temperature grown GaAs layers by RS and SAXS is exemplarily presented.

Citation Download Citation

M. Herms, G. Irmer, P. Verma, and G. Goerigk "Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering", Proc. SPIE 5766, Testing, Reliability, and Application of Micro- and Nano-Material Systems III, (9 May 2005); https://doi.org/10.1117/12.602064

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