Correlation between destruction of the metal surface caused by pitting corrosion and intensity of the observed electrochemical noise

Janusz M. Smulko; A. Zielinski; Kazimierz Darowicki

doi:10.1117/12.609830

23 May 2005 Correlation between destruction of the metal surface caused by pitting corrosion and intensity of the observed electrochemical noise (Invited Paper)

Janusz M. Smulko, A. Zielinski, Kazimierz Darowicki

Author Affiliations +

Proceedings Volume 5846, Noise and Information in Nanoelectronics, Sensors, and Standards III; (2005) https://doi.org/10.1117/12.609830
Event: SPIE Third International Symposium on Fluctuations and Noise, 2005, Austin, Texas, United States

Abstract

Electrochemical noise (EN) has been intensively investigated for the last few decades. There are practical applications of EN measurements for corrosion recognition but the phenomenon needs still further research. The experimental results of correlation between the surface damages of the metal electrodes and the intensity of voltage fluctuations observed between two nominally identically prepared electrodes are presented. The sets of carbon steel electrodes were applied. Only the metal surfaces were exposed to the electrolyte. The low-frequency voltage noise was continuously registered and the pictures of the electrode surfaces were taken every 30 minutes. The pits, which were created on the metal surface, were detected by Matlab software and compared with the statistical parameters of the observed voltage noise. The acts of the individual pits creation were strictly related to the presence and intensity of transients, characteristic for meta-stable pitting processes in carbon steel. The experimental setup is described. Some detailed remarks according to the applied detection algorithms of the metal damage are also included.

Citation Download Citation

Janusz M. Smulko, A. Zielinski, and Kazimierz Darowicki "Correlation between destruction of the metal surface caused by pitting corrosion and intensity of the observed electrochemical noise (Invited Paper)", Proc. SPIE 5846, Noise and Information in Nanoelectronics, Sensors, and Standards III, (23 May 2005); https://doi.org/10.1117/12.609830

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